The JAI Sweep+ SW-4010Q-MCL is a prism-based industrial line scan camera with four image sensors. The camera allows for simultaneous collection of red, green and blue image data on three separate CMOS sensors, plus a fourth sensor that collects image data from the Short Wave InfraRed (SWIR) spectrum using a sensor based on indium gallium arsenide (InGaAs) technology.
The SW-4010Q-MCL’s prism technology aligns all four sensors to the same optical plane so that red, green, blue, and SWIR image data can all be captured in a single pass with precise pixel-level correlation and no parallax issues. This results in machine vision systems with lower set-up complexity and lower hardware costs.
The camera’s three CMOS sensors provide complete coverage of the visible spectrum from 400 nm to 700 nm, while the InGaAs sensor captures light waves ranging from approximately 800 nm to 1700 nm. This enables precise color inspection of surface features while also looking beneath the surface for additional “hidden” image data.
Built-in scaling, ROI, and binning functions let users easily align the line rate and field-of-view between visible and SWIR channels while setting RGB pixel resolution to be the same as the SWIR channel, twice the SWIR channel, or a custom resolution factor.
4-sensor prism-based line scan camera for simultaneous R-G-B plus SWIR imaging.
3 x CMOS sensors for detecting R-G-B visible light (400 ~ 700 nm)
1 x InGaAs sensor for detecting SWIR light (800 ~ 1700 nm).
Xscale and ROI functions to synchronize sensor width and line scan speed of the two different sensor types.
Built-in color space conversion (RGB channels only).
Individual gain and shutter time settings for each channel.
Dual-stream data output (RGB and SWIR in separate streams).
Horizontal and vertical binning (for RGB sensors).
Supports direct connection to rotary encoders when connecting via frame grabber is undesirable.
Noise reduction filters.
Flat shading correction (RGB & SWIR).
Color shading correction (RGB).
Mini-Camera Link interface.
M-52 mount.
Multispectral lens available (sold separately) optimized to maintain focus for visible and SWIR channels.
Sweep+ Series
SW-4010Q-MCL
Line Scan
Multispectral
4-Bands R-G-B + SWIR
N/A
4096 x 1 px / 1024 x 1 px
39 kHz
Yes
Mini Camera Link
3x CMOS + 1x InGaAs
Custom
30.72 mm / 25.6 mm
7.5 x 7.5 µm / 25.0 x 25.0 µm
Global shutter
30.8 mm
30.8 mm / 25.6 mm
90 x 90 x 120 mm
900 g
8/10/12-bit
M52-Mount
Watt
-5°C to +45°C
A universal power supply that works with all JAI cameras equipped with a 12-pin Hirose power connector. Four versions are available:
PD-12UUP U.S. plug with 12-pin Hirose connector to camera
PD-12UEP European plug with 12-pin Hirose connector to camera
PD-12UU U.S. plug, flying leads (no 12-pin connector)
PD-12UE European plug, flying leads (no 12-pin connector)
Download Datasheet
The 10P-10M-AUX is 10-meter cable for JAI cameras equipped with a 10-pin Hirose “auxiliary” connector. The plug at one end of the cable connects to the 10-pin connector on the back of the JAI camera. Flying leads at the other end of the cable can be used to send/receive TTL signals to/from specific pins on the auxiliary connector. Not all I/O functions may be supported depending on the pinout of each camera model. Check the pinout carefully or consult with JAI before purchasing.
Download a datasheet
The HR10A-10P-12S is a universal connector used for power and control signals for many JAI cameras. The connector is a female plug, with sockets, that mates to the connector on the back of the camera. It has soldering cups for easy assembly of custom cables.
This cable features flying leads on one end and a Hirose 12-pin connector on the other wired to match the pinout of JAI cameras with 12-pin connectors. The flying leads enable power to be supplied via two of the Hirose pins, while the remaining wires/pins can be utilized to access various I/O functions of JAI cameras (see individual camera datasheets/manuals for functions accessible through the Hirose connectors).
The cables can be used with JAI’s own “flying leads” power supplies, or with third-party or custom power supply systems.
Sweep+ line scan cameras are the ideal choice if you have machine vision systems needing inspection in both the visible and SWIR light wave range.
Fruit and vegetable inspection that simultaneously looks at colors, ripeness, damages, signs of rot under skin, as well as detecting foreign objects (e.g. stones, metal pieces etc.).
The color, size, shape and damage of nuts and almonds can be inspected using a visible channel, while foreign objects (including olive pits) are more clearly seen with the SWIR channel.
Inspection systems in the semiconductor industry can be used to find defects on the surface and below the surface of silicon wafers, as those materials have a high spectral transmittance in the SWIR waveband.
Inspect the finished package on the outside (looking at the color printing and package completeness) and at the same time look through opaque plastic packages and containers to check for correct amount of content or fill levels.
The combined R-G-B and SWIR inspection is ideal for checking pharmaceutical packaging as well as currency inspection looking at color correctness, watermarks and security features woven into the bank notes.
Flawless batteries are critical for safety, energy density and to prevent early degradation. Line scan cameras can be used to check for defects such as scratches, dents, craters, inclusions, bubbles, and holes on electrode sheets.
Precision agriculture or intelligent farming has seen an exponential growth in the recent years. Removal of weeds/ wild plants or precision crop harvesting is of growing importance in intelligent farming and R-G-B- SWIR multi-spectral cameras are playing a vital role.
Other applications include various web inspection tasks in connection with the manufacturing of items such as color tiles and textiles (checking if dyed textile is dry enough for further processing).
Surface inspection of flat panels/displays inspecting color correctness and looking for defective screen pixels, scratches, or other defects.
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