JAI | JAI line scan camera. Visible R-G-B + SWIR imaging with a…

Sweep+ Series
Simultaneous capture of R-G-B-SWIR images.

The JAI Sweep+ SW-4010Q-MCL is a prism-based industrial line scan camera with four image sensors. The camera allows for simultaneous collection of red, green and blue image data on three separate CMOS sensors, plus a fourth sensor that collects image data from the Short Wave InfraRed (SWIR) spectrum using a sensor based on indium gallium arsenide (InGaAs) technology.

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Product Image SW 4010 Q MCL front45 410x370px RI
Product Image SW 4010 Q MCL rear45 410x370px RI
Product Image SW 4010 Q MCL front 410x370px RI
Product Image SW 4010 Q MCL rear 410x370px
Product Image SW 4010 Q MCL side 410x370px

Simultaneous visible and SWIR inspection with a single camera

The SW-4010Q-MCL’s prism technology aligns all four sensors to the same optical plane so that red, green, blue, and SWIR image data can all be captured in a single pass with precise pixel-level correlation and no parallax issues. This results in machine vision systems with lower set-up complexity and lower hardware costs.

Broad multispectral coverage

The camera’s three CMOS sensors provide complete coverage of the visible spectrum from 400 nm to 700 nm, while the InGaAs sensor captures light waves ranging from approximately 800 nm to 1700 nm. This enables precise color inspection of surface features while also looking beneath the surface for additional “hidden” image data.

Flexible synchronization options

Built-in scaling, ROI, and binning functions let users easily align the line rate and field-of-view between visible and SWIR channels while setting RGB pixel resolution to be the same as the SWIR channel, twice the SWIR channel, or a custom resolution factor.


  • 4-sensor prism-based line scan camera for simultaneous R-G-B plus SWIR imaging.

  • 3 x CMOS sensors for detecting R-G-B visible light (400 ~ 700 nm)

  • 1 x InGaAs sensor for detecting SWIR light (800 ~ 1700 nm).

  • Xscale and ROI functions to synchronize sensor width and line scan speed of the two different sensor types.

  • Built-in color space conversion (RGB channels only).

  • Individual gain and shutter time settings for each channel.

  • Dual-stream data output (RGB and SWIR in separate streams).

  • Horizontal and vertical binning (for RGB sensors).

  • Supports direct connection to rotary encoders when connecting via frame grabber is undesirable.

  • Noise reduction filters.

  • Flat shading correction (RGB & SWIR).

  • Color shading correction (RGB).

  • Mini-Camera Link interface.

  • M-52 mount.

  • Multispectral lens available (sold separately) optimized to maintain focus for visible and SWIR channels.


Product Line

Sweep+ Series




Line Scan

Color / Mono


Light Spectrum

4-Bands R-G-B + SWIR



Resolution WxH

4096 x 1 px / 1024 x 1 px

Frame rate / Line rate

39 kHz




Mini Camera Link


3x CMOS + 1x InGaAs

Sensor Name


Optical Format

30.72 mm / 25.6 mm

Cell Size WxH

7.5 x 7.5 µm / 25.0 x 25.0 µm

Shutter type

Global shutter

Sensor Diagonal

30.8 mm

Active Sensor Dimensions WxH

30.8 mm / 25.6 mm

Camera Dimensions HxWxL

90 x 90 x 120 mm


900 g

Video Output


Lens Mount


Power Consumption


Operating Temperature (ambient)

-5°C to +45°C

Dimension Image SW 4010 Q MCL Side

Typical applications where Sweep+ Series R-G-B-SWIR cameras are suitable:

Sweep+ line scan cameras are the ideal choice if you have machine vision systems needing inspection in both the visible and SWIR light wave range.

Fruit and vegetable inspection

Fruit and vegetable inspection that simultaneously looks at colors, ripeness, damages, signs of rot under skin, as well as detecting foreign objects (e.g. stones, metal pieces etc.).

Inspection of nuts, almonds and olives

The color, size, shape and damage of nuts and almonds can be inspected using a visible channel, while foreign objects (including olive pits) are more clearly seen with the SWIR channel.

Semiconductor/wafer inspection

Inspection systems in the semiconductor industry can be used to find defects on the surface and below the surface of silicon wafers, as those materials have a high spectral transmittance in the SWIR waveband.

Pharmaceutical inspection

Inspect the finished package on the outside (looking at the color printing and package completeness) and at the same time look through opaque plastic packages and containers to check for correct amount of content or fill levels.

Print inspection

The combined R-G-B and SWIR inspection is ideal for checking pharmaceutical packaging as well as currency inspection looking at color correctness, watermarks and security features woven into the bank notes.

Battery inspection

Flawless batteries are critical for safety, energy density and to prevent early degradation. Line scan cameras can be used to check for defects such as scratches, dents, craters, inclusions, bubbles, and holes on electrode sheets.

Agriculture and forestry

Precision agriculture or intelligent farming has seen an exponential growth in the recent years. Removal of weeds/ wild plants or precision crop harvesting is of growing importance in intelligent farming and R-G-B- SWIR multi-spectral cameras are playing a vital role.

Web inspection

Other applications include various web inspection tasks in connection with the manufacturing of items such as color tiles and textiles (checking if dyed textile is dry enough for further processing).

LCD Inspection

Surface inspection of flat panels/displays inspecting color correctness and looking for defective screen pixels, scratches, or other defects.

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