JAI offers advanced SWIR line scan cameras based on InGaAs (Indium Gallium Arsenide) sensor technology for high-speed industrial inspection applications. These Short-Wave Infrared (SWIR) cameras reveal details that are invisible to conventional visible-light imaging systems, enabling reliable detection of moisture content, material variations, and hidden defects.
SWIR line scan imaging is particularly well suited for continuous inspection of webs, sheets, and moving products. This technology improves inspection accuracy and process efficiency across a wide range of applications, including food sorting, semiconductor and wafer inspection, recycling, and waste management.
The current SWIR line scan camera offering is available in the Wave Series. Featuring large 12.5 μm square pixels, these cameras provide high light sensitivity and excellent signal-to-noise performance, even in challenging imaging conditions. A 14-bit video output delivers 16,384 grayscale levels, enabling precise differentiation of materials and reliable detection of subtle defects.
In addition to SWIR line scan cameras, JAI offers single-sensor SWIR area scan cameras based on advanced InGaAs sensor technology for a broad range of industrial inspection applications.
* Note: Models with 'YES' in the ROI column can be adjusted to lower resolutions at higher frame rates. For more information, please download the frame rate calculator available on the specific product page or consult JAI for assistance.