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Wave Series
WAL-1001-GE
High-performance InGaAs SWIR line scan camera

The WAL-1001-GE is a high-performance industrial InGaAs SWIR line scan camera offering 1K resolution.
Featuring 12.5 µm × 12.5 µm pixels and a GigE Vision interface, it ensures efficient and reliable data transfer. With a maximum line rate of 29 kHz (29,000 lines/s), the camera is well suited for demanding inspection applications such as fruit and vegetable sorting, wafer inspection, recycling, and other applications.

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Product Image WAL 1001 GE Direct front
Product Image WAL 1001 GE 45 degree front 410x370
Product Image WAL 1001 GE Side view
Product Image WAL 1001 GE 45 degree back angle
Product Image WAL 1001 GE Direct back view

Large pixel size, excellent infrared response

The 12.5 µm pixel pitch provides high signal-to-noise ratio and sensitivity, enabling reliable detail capture even in challenging imaging conditions.

High sensitivity

With a peak quantum efficiency of up to 83%, the camera delivers high sensitivity in the SWIR range, enabling reliable imaging at high shutter speeds and in low-light conditions without compromising image quality.

Flexible High Bit-Depth Output

Support for Mono 8-, 10-, 12-, and 14-bit output enables precise intensity representation, delivering smoother grayscale gradients and improved measurement accuracy in demanding SWIR inspection applications.

Features

  • 1K resolution line scan (1 x 1024)

  • 12.8 mm wide sensor with 12.5 µm square pixels

  • Up to 29 kHz (29,000 lines/s) scan rate

  • GigE Vision interface for efficient data transfer

  • InGaAs-based SWIR industrial camera (900–1700 nm spectral response)

  • Selectable output formats (Mono8/10/12/14-bit)

  • Image optimization features include non-uniformity correction, online flat-field correction (FFC), defective pixel correction (DPC), black level control, and LUT support for optimized image quality

  • Gain control includes digital gain and analog gain

  • Standard C-mount

Specifications

Product Line

Wave Series

Model

WAL-1001-GE

Type

Line Scan

Color / Mono

Mono

Light Spectrum

SWIR

Resolution

MP

Resolution WxH

1K

Frame rate / Line rate

29 kHz

ROI

No

Interface

GigE Vision

Sensors

1xInGaAs

Sensor Name

N/A

Optical Format

12.8 mm

Cell Size WxH

12.5 x 12.5µm

Shutter type

Global shutter

Sensor Diagonal

12.8 mm

Active Sensor Dimensions WxH

12.8 mm

Camera Dimensions HxWxL

60 x 60 x 57.6 mm

Weight

309 g

Video Output

8/10/12/14-bit

Lens Mount

C-mount

Power Consumption

4.3 Watt

Operating Temperature (ambient)

-20°C to +55°C

Typical applications

WAL-1001-GE SWIR line scan camera is a perfect fit for a wide range of machine vision applications.

Fruit and Vegetable Sorting and Grading

SWIR imaging uses C–H and O–H absorption bands to assess material composition and moisture content, enabling detection of contamination, foreign materials, and internal quality attributes such as bruising, ripeness variation, and early mold growth.

Wafer inspection

SWIR imaging enables high-speed wafer inspection to detect hidden cracks and subsurface damage in silicon, including defects introduced during wafer dicing.

Recycling

SWIR imaging enables reliable identification of plastics, paper, textiles, and composites on fast-moving conveyors, distinguishing visually similar polymers and detecting black or dark plastics beyond visible and NIR capabilities.

Pharmaceutical and fill level inspection

SWIR line scan imaging enables non-contact verification of liquid presence and fill levels through glass or plastic containers, using water-based absorption features to detect missing, underfilled, or inconsistent contents.

Plastic seal inspection

Line scan inspection in the short-wave infrared range enables reliable verification of heat seals in transparent or opaque plastic packaging on continuous production lines, supporting detection of seal defects such as bubbles, wrinkles, improper sealing, and closure strip irregularities that are difficult to identify using visible-light imaging.

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