JAI offers advanced SWIR area scan cameras based on InGaAs (Indium Gallium Arsenide) sensor technology for industrial machine vision applications. These Short-Wave Infrared (SWIR) cameras reveal details that are invisible to conventional cameras, enabling enhanced inspection, material identification, moisture detection, and defect detection.
JAI’s single-sensor SWIR technology provides spectral sensitivity from 400 nm to approximately 1700 nm, allowing simultaneous capture of both visible and SWIR image data. This Visible + SWIR capability delivers richer image information while simplifying system integration.
The current SWIR area scan camera offering is available in the Wave Series with the WAA-1300-GE-TEC. Featuring a high-performance Sony InGaAs sensor and ThermoElectric Cooling (TEC), the camera delivers low-noise imaging and stable performance for demanding inspection applications.
For high-speed continuous inspection, JAI also offers single-sensor SWIR line scan cameras based on InGaAs sensor technology.
* Note: Models with 'YES' in the ROI column can be adjusted to lower resolutions at higher frame rates. For more information, please download the frame rate calculator available on the specific product page or consult JAI for assistance.